Bruker DektakXT Advanced Stylus Profilometer

A small tip is scanned across the surface of a sample to measure surface topography. It is used for step height, roughness, and stress measurements.

Motorized XY stage – 150mm X 150mm

Motorized theta stage

Four to six-inch wafer vacuum chuck 

Stitching capability

3D mapping and analysis  

2D stress measurements

Automated measurements