Nanofabrication Facility

Characterization Lab Equipment

Bruker DektakXT Advanced Stylus Profilometer

Specifications

Bruker Dimension IconĀ® Atomic Force Microscope

Specifications

Olympus OLS4000 Laser Microscope

Specifications

Rigaku X-Ray Diffraction (XRD) Instrument

Specifications

NETZSCH STA 449 Simultaneous Thermal Analyzer

Specifications

ZEISS Axio Imager.M2m Inspection Microscope

Specifications