Characterization Lab EquipmentHome / Characterization Lab Equipment Bruker DektakXT Advanced Stylus Profilometer Specifications Bruker Dimension IconĀ® Atomic Force Microscope Specifications Olympus OLS4000 Laser Microscope Specifications Rigaku X-Ray Diffraction (XRD) Instrument Specifications NETZSCH STA 449 Simultaneous Thermal Analyzer Specifications ZEISS Axio Imager.M2m Inspection Microscope Specifications