Nanofabrication Facility

ZEISS Axio Imager.M2m Inspection Microscope

This microscope is in the characterization lab and is used for the inspection and analysis of structures.

25X, 50X, 100X, 200X, 500X, and 1000X magnification

Motorized focus drive, nosepiece, reflector turret

Motorized Z-stack functionality

Brightfield, Darkfield, Circular DIC

Workstation with motorized acquisition software